2003

1. Magnetic force microscopy and x-ray scattering study of 70×550 nm2 pseudo-spin-valve nanomagnets

   Journal of Applied Physics

2. Soft X-Ray Resonant Scattering: An Element-Specific Tool to Characterize Patterned Arrays of Nanomagnets

   IEEE Transactions on Magnetics, Vol. 39, Núm. 5 II, pp. 3450-3452

3. Soft X-ray diffraction: An element sensitive tool to characterize patterned arrays of nanomagnets

   Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference

4. Soft x-ray diffraction: An element sensitive tool to characterize patterned arrays of nanomagnets

   Digests of the Intermag Conference