Constant probe orientation for fast contact-based inspection of 3D free-form surfaces using (3+2)-axis inspection machines

1. Sliusarenko, O.
2. Escudero, G.G.
3. González, H.
4. Calleja, A.
5. Bartoň, M.
6. Ortega, N.
7. de Lacalle, L.N.L.

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DOI: 10.1016/J.PRECISIONENG.2023.06.013 GOOGLE SCHOLAR lock_openOpen access editor

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