Constant probe orientation for fast contact-based inspection of 3D free-form surfaces using (3+2)-axis inspection machines

  1. Sliusarenko, O.
  2. Escudero, G.G.
  3. González, H.
  4. Calleja, A.
  5. Bartoň, M.
  6. Ortega, N.
  7. de Lacalle, L.N.L.
Aldizkaria:
Precision Engineering

ISSN: 0141-6359

Argitalpen urtea: 2023

Alea: 84

Orrialdeak: 37-44

Mota: Artikulua

DOI: 10.1016/J.PRECISIONENG.2023.06.013 GOOGLE SCHOLAR lock_openSarbide irekia editor
Datuen iturria: Scopus