A method to extract lumped thermal networks of capacitors for reliability oriented design
- Delmonte, N.
- Cabezuelo, D.
- Kortabarria, I.
- Santoro, D.
- Toscani, A.
- Cova, P.
Journal:
Microelectronics Reliability
ISSN: 0026-2714
Year of publication: 2020
Volume: 114
Type: Article