A method to extract lumped thermal networks of capacitors for reliability oriented design

  1. Delmonte, N.
  2. Cabezuelo, D.
  3. Kortabarria, I.
  4. Santoro, D.
  5. Toscani, A.
  6. Cova, P.
Aldizkaria:
Microelectronics Reliability

ISSN: 0026-2714

Argitalpen urtea: 2020

Alea: 114

Mota: Artikulua

DOI: 10.1016/J.MICROREL.2020.113737 GOOGLE SCHOLAR lock_openeBiltegia editor
Datuen iturria: Scopus