A method to extract lumped thermal networks of capacitors for reliability oriented design

  1. Delmonte, N.
  2. Cabezuelo, D.
  3. Kortabarria, I.
  4. Santoro, D.
  5. Toscani, A.
  6. Cova, P.
Journal:
Microelectronics Reliability

ISSN: 0026-2714

Year of publication: 2020

Volume: 114

Type: Article

DOI: 10.1016/J.MICROREL.2020.113737 GOOGLE SCHOLAR lock_openeBiltegia editor
Data source: Scopus