Estimating the SEU failure rate of designs implemented in FPGAs in presence of MCUs

  1. Villalta, I.
  2. Bidarte, U.
  3. Gomez-Cornejo, J.
  4. Lázaro, J.
  5. Astarloa, A.
Journal:
Microelectronics Reliability

ISSN: 0026-2714

Year of publication: 2017

Volume: 78

Pages: 85-92

Type: Article

DOI: 10.1016/J.MICROREL.2017.08.003 GOOGLE SCHOLAR
Data source: Scopus