Estimating the SEU failure rate of designs implemented in FPGAs in presence of MCUs
- Villalta, I.
- Bidarte, U.
- Gomez-Cornejo, J.
- Lázaro, J.
- Astarloa, A.
Journal:
Microelectronics Reliability
ISSN: 0026-2714
Year of publication: 2017
Volume: 78
Pages: 85-92
Type: Article