Test workbench for electronic telecommunication systems

  1. Arias, J.
  2. Jiménez, J.
  3. Aranguren, G.
  4. Lázaro, J.
  5. Martín, J.L.
Proceedings:
IECON Proceedings (Industrial Electronics Conference)

Year of publication: 2002

Volume: 3

Pages: 2509-2514

Type: Conference paper

DOI: 10.1109/IECON.2002.1185368 GOOGLE SCHOLAR
Data source: Scopus