Arkitektura Goi Eskola Teknikoa
Ikastegia
Université de Toulouse
Tolosa, FranciaUniversité de Toulouse-ko ikertzaileekin lankidetzan egindako argitalpenak (2)
2010
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Dielectric properties of thin insulating layers measured by electrostatic force microscopy
EPJ Applied Physics, Vol. 50, Núm. 1
2009
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Determination of the nanoscale dielectric constant by means of a double pass method using electrostatic force microscopy
Journal of Applied Physics, Vol. 106, Núm. 2