Publications by the researcher in collaboration with JUAN COLMENERO DE LEON (2)

2010

  1. Dielectric properties of thin insulating layers measured by electrostatic force microscopy

    EPJ Applied Physics, Vol. 50, Núm. 1

2009

  1. Determination of the nanoscale dielectric constant by means of a double pass method using electrostatic force microscopy

    Journal of Applied Physics, Vol. 106, Núm. 2