Centre National de la Recherche Scientifique-ko ikertzaileekin lankidetzan egindako argitalpenak (6)

2011

  1. Contrast inversion in electrostatic force microscopy imaging of trapped charges: Tip-sample distance and dielectric constant dependence

    Nanotechnology, Vol. 22, Núm. 34

  2. On the use of electrostatic force microscopy as a quantitative subsurface characterization technique: A numerical study

    Applied Physics Letters, Vol. 99, Núm. 2

2010

  1. Dielectric properties of thin insulating layers measured by electrostatic force microscopy

    EPJ Applied Physics, Vol. 50, Núm. 1

  2. Imaging dielectric relaxation in nanostructured polymers by frequency modulation electrostatic force microscopy

    Applied Physics Letters, Vol. 96, Núm. 21

  3. Nanodielectric mapping of a model polystyrene-poly(vinyl acetate) blend by electrostatic force microscopy

    Physical Review E - Statistical, Nonlinear, and Soft Matter Physics, Vol. 81, Núm. 1

2009

  1. Determination of the nanoscale dielectric constant by means of a double pass method using electrostatic force microscopy

    Journal of Applied Physics, Vol. 106, Núm. 2