CT Image Quality Influence on Different Material Edge Response Functions for Accurate Metrological Applications
- N. Ortega
- S. Plaza
- J. Iglesias
- I. Holgado
- A. Pascual
- José Carlos Rico Fernández (ed. lit.)
- Eduardo Cuesta González (ed. lit.)
- Gonzalo Valiño Riestra (ed. lit.)
- Víctor Manuel Meana Díaz (ed. lit.)
- Pedro Fernández Álvares (ed. lit.)
Argitaletxea: Manufacturing Engineering Society International
ISBN: 9788409292295
Argitalpen urtea: 2021
Orrialdeak: 107-107
Biltzarra: Manufacturing Engineering Society International Conference (9. 2021. Gijón)
Mota: Biltzar ekarpena