Local Defect Simulation by Means of the Distributed Circuit Modelling

  1. Otaegi, A.
  2. Cereceda, E.
  3. Fano, V.
  4. Azkona, N.
  5. Recart, F.
  6. Gutiérrez, J.R.
  7. Jimeno, J.C.
Proceedings:
AIP Conference Proceedings

ISSN: 1551-7616,  0094-243X

ISBN: 9780735443624

Year of publication: 2022

Volume: 2487

Type: Conference paper

DOI: 10.1063/5.0089323 GOOGLE SCHOLAR lock_openOpen access editor
Data source: Scopus