Local Defect Simulation by Means of the Distributed Circuit Modelling

  1. Otaegi, A.
  2. Cereceda, E.
  3. Fano, V.
  4. Azkona, N.
  5. Recart, F.
  6. Gutiérrez, J.R.
  7. Jimeno, J.C.
Aktak:
AIP Conference Proceedings

ISSN: 1551-7616,  0094-243X

ISBN: 9780735443624

Argitalpen urtea: 2022

Alea: 2487

Mota: Biltzar ekarpena

DOI: 10.1063/5.0089323 GOOGLE SCHOLAR lock_openSarbide irekia editor
Datuen iturria: Scopus