Conducting tip atomic force microscopy analysis of aluminum oxide barrier defects decorated by electrodeposition

  1. Carrey, J.
  2. Bouzehouane, K.
  3. George, J.-M.
  4. Ceneray, C.
  5. Fert, A.
  6. Vaurès, A.
  7. Kenane, S.
  8. Piraux, L.
Revue:
Applied Physics Letters

ISSN: 0003-6951

Année de publication: 2001

Volumen: 79

Número: 19

Pages: 3158-3160

Type: Article

DOI: 10.1063/1.1415775 GOOGLE SCHOLAR
La source de données: Scopus