A method to extract lumped thermal networks of capacitors for reliability oriented design

  1. Delmonte, N.
  2. Cabezuelo, D.
  3. Kortabarria, I.
  4. Santoro, D.
  5. Toscani, A.
  6. Cova, P.
Revue:
Microelectronics Reliability

ISSN: 0026-2714

Année de publication: 2020

Volumen: 114

Type: Article

DOI: 10.1016/J.MICROREL.2020.113737 GOOGLE SCHOLAR lock_openeBiltegia editor
La source de données: Scopus