A method to extract lumped thermal networks of capacitors for reliability oriented design

  1. Delmonte, N.
  2. Cabezuelo, D.
  3. Kortabarria, I.
  4. Santoro, D.
  5. Toscani, A.
  6. Cova, P.
Zeitschrift:
Microelectronics Reliability

ISSN: 0026-2714

Datum der Publikation: 2020

Ausgabe: 114

Art: Artikel

DOI: 10.1016/J.MICROREL.2020.113737 GOOGLE SCHOLAR lock_openeBiltegia editor
Datenquelle: Scopus