Langmuir probe and optical emission spectroscopy studies for RF magnetron sputtering during TiON thin film deposition

  1. Metawa, A.E.
  2. El-Hossary, F.M.
  3. Raaif, M.
  4. SalahEl-Deen, M.
  5. El-Moula, A.A.A.
Revue:
Chinese Journal of Physics

ISSN: 0577-9073

Année de publication: 2020

Volumen: 68

Pages: 168-177

Type: Article

DOI: 10.1016/J.CJPH.2020.09.012 GOOGLE SCHOLAR