Langmuir probe and optical emission spectroscopy studies for RF magnetron sputtering during TiON thin film deposition

  1. Metawa, A.E.
  2. El-Hossary, F.M.
  3. Raaif, M.
  4. SalahEl-Deen, M.
  5. El-Moula, A.A.A.
Aldizkaria:
Chinese Journal of Physics

ISSN: 0577-9073

Argitalpen urtea: 2020

Alea: 68

Orrialdeak: 168-177

Mota: Artikulua

DOI: 10.1016/J.CJPH.2020.09.012 GOOGLE SCHOLAR