Detecting Critical Resonances in Microwave Amplifiers through Noise Simulations

  1. Collantes, J.M.
  2. Otegi, N.
  3. Anakabe, A.
  4. Mori, L.
  5. Barcenilla, A.
  6. Gonzalez-Perez, J.M.
Proceedings:
2018 IEEE MTT-S Latin America Microwave Conference, LAMC 2018 - Proceedings

ISBN: 9781538673331

Year of publication: 2018

Type: Conference paper

DOI: 10.1109/LAMC.2018.8699028 GOOGLE SCHOLAR

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