Local characterization of ultrathin oxides on silicon wafers by scanning tunneling microscopy
- Vasquez de Parga, A.L.
- Ocal, C.
- Ortega, J.E.
- Miranda, R.
ISSN: 0042-207X
Argitalpen urtea: 1990
Alea: 41
Zenbakia: 4-6
Orrialdeak: 784-786
Mota: Artikulua