Local characterization of ultrathin oxides on silicon wafers by scanning tunneling microscopy
- Vasquez de Parga, A.L.
- Ocal, C.
- Ortega, J.E.
- Miranda, R.
ISSN: 0042-207X
Year of publication: 1990
Volume: 41
Issue: 4-6
Pages: 784-786
Type: Article
ISSN: 0042-207X
Year of publication: 1990
Volume: 41
Issue: 4-6
Pages: 784-786
Type: Article