Defects detection in p-n junction isolation by electroluminescence

  1. Fano, V.
  2. Otaegi, A.
  3. Azkona, N.
  4. Cereceda, E.
  5. Pérez, L.
  6. Rodríguez, P.
  7. Recart, F.
  8. Gutiérrez, J.R.
  9. Jimeno, J.C.
Aktak:
AIP Conference Proceedings

ISSN: 1551-7616 0094-243X

ISBN: 9780735417151

Argitalpen urtea: 2018

Alea: 1999

Mota: Biltzar ekarpena

DOI: 10.1063/1.5049245 GOOGLE SCHOLAR