Defects detection in p-n junction isolation by electroluminescence

  1. Fano, V.
  2. Otaegi, A.
  3. Azkona, N.
  4. Cereceda, E.
  5. Pérez, L.
  6. Rodríguez, P.
  7. Recart, F.
  8. Gutiérrez, J.R.
  9. Jimeno, J.C.
Proceedings:
AIP Conference Proceedings

ISSN: 1551-7616,  0094-243X

ISBN: 9780735417151

Year of publication: 2018

Volume: 1999

Type: Conference paper

DOI: 10.1063/1.5049245 GOOGLE SCHOLAR
Data source: Scopus