Model Matching with Improved Transmission of Measuring Errors

  1. De La Sen, M.
Journal:
IEEE Transactions on Industrial Electronics

ISSN: 1557-9948,  0278-0046

Year of publication: 1984

Volume: IE-31

Issue: 1

Pages: 3-8

Type: Article

DOI: 10.1109/TIE.1984.350011 GOOGLE SCHOLAR
Data source: Scopus