Determination of defect content and defect profile in semiconductor heterostructures

  1. Zubiaga, A.
  2. Garcia, A.
  3. Plazaola, F.
  4. Z̃iga-Pérez, J.
  5. Mũoz-Sanjosé, V.
Aktak:
Journal of Physics: Conference Series

ISSN: 1742-6596,  1742-6588

Argitalpen urtea: 2011

Alea: 265

Zenbakia: 1

Mota: Biltzar ekarpena

DOI: 10.1088/1742-6596/265/1/012004 GOOGLE SCHOLAR
Datuen iturria: Scopus