Determination of defect content and defect profile in semiconductor heterostructures

  1. Zubiaga, A.
  2. Garcia, A.
  3. Plazaola, F.
  4. Z̃iga-Pérez, J.
  5. Mũoz-Sanjosé, V.
Proceedings:
Journal of Physics: Conference Series

ISSN: 1742-6596,  1742-6588

Year of publication: 2011

Volume: 265

Issue: 1

Type: Conference paper

DOI: 10.1088/1742-6596/265/1/012004 GOOGLE SCHOLAR
Data source: Scopus