Friction measurements of CNx and TiCxNy films by scanning force microscopy

  1. Morant, C.
  2. Fernández, L.A.
  3. Quirós, C.
  4. Fuentes, G.G.
  5. Elizalde, E.
  6. Sanz, J.M.
Journal:
Surface and Interface Analysis

ISSN: 0142-2421

Year of publication: 2000

Volume: 30

Issue: 1

Pages: 638-642

Type: Article

DOI: 10.1002/1096-9918(200008)30:1<638::AID-SIA805>3.0.CO;2-S GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus