Publicaciones en las que colabora con MARIA ARANZAZU MENDIOROZ ASTIGARRAGA (18)

2020

  1. Pitzadura bertikalen detekzio eta karakterizazioa termografia infragorria eta laser mugikorra erabiliz

    Ekaia: Euskal Herriko Unibertsitateko zientzi eta teknologi aldizkaria, Núm. 37, pp. 211-220

2018

  1. Thermal effusivity measurements of thermal insulators using the photopyroelectric technique in the front configuration

    Measurement: Journal of the International Measurement Confederation, Vol. 121, pp. 96-102

2014

  1. Extending the flash method to measure the thermal diffusivity of semitransparent solids

    Measurement Science and Technology, Vol. 25, Núm. 3

  2. Termografia infragorri aktiboa materialen azterketarako

    Ekaia: Euskal Herriko Unibertsitateko zientzi eta teknologi aldizkaria, Núm. 27, pp. 193-207

2010

  1. A thermal paradox: Which gets warmer?

    European Journal of Physics, Vol. 31, Núm. 5, pp. 1053-1059

  2. Analysis of the Tikhonov regularization to retrieve thermal conductivity depth-profiles from infrared thermography data

    Journal of Applied Physics, Vol. 108, Núm. 6

  3. Characterization of delaminations by lock-in vibrothermography

    Journal of Physics: Conference Series

  4. Tikhonov and TV regularizations to retrieve thermal conductivity depth-profiles from infrared thermography data

    Numerical simulation in Physics and Engineering: proceedings of the XIV Spanish-French Jacques-Louis Lions School : (A Coruña, Spain, September 6-10th, 2010)

2008

  1. Thermal characterization of rods, tubes and spheres using pulsed infrared thermography

    Journal of Physics D: Applied Physics, Vol. 41, Núm. 1

  2. Thermal wave scattering by two overlapping and parallel cylinders

    Applied Physics A: Materials Science and Processing, Vol. 93, Núm. 2, pp. 429-437

2002

  1. Anti-stokes laser cooling in Yb3+-doped KPb2Cl5 crystal

    Optics Letters, Vol. 27, Núm. 17, pp. 1525-1527

  2. Origin of laser-induced internal cooling of Yb3+-doped systems

    Proceedings of SPIE - The International Society for Optical Engineering, Vol. 4645, pp. 135-147