Nano-oxidation of silicon surfaces: Comparison of noncontact and contact atomic-force microscopy methods

  1. Tello, M.
  2. García, R.
Revue:
Applied Physics Letters

ISSN: 0003-6951

Année de publication: 2001

Volumen: 79

Número: 3

Pages: 424-426

Type: Article

DOI: 10.1063/1.1385582 GOOGLE SCHOLAR