Combined analysis of systematic and random uncertainties for different noise-figure characterization methodologies

  1. Collado, A
  2. Collantes, JM
  3. De la Fuente, L
  4. Otegi, N
  5. Perea, L
  6. Sayed, M
Liburu bilduma:
2003 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3
  1. Thal, H (coord.)

ISSN: 0149-645X,  2576-7216

ISBN: 0-7803-7695-1

Argitalpen urtea: 2003

Orrialdeak: 1419-1422

Biltzarra: IEEE MTT-S International Microwave Symposium

Mota: Biltzar ekarpena

DOI: 10.1109/MWSYM.2003.1212638 GOOGLE SCHOLAR
Datuen iturria: WoS