Robust Detection of High-Frequency Signals at the Nanoscale
- Munuera-Javaloy, C.
- Ban, Y.
- Chen, X.
Aldizkaria:
Physical Review Applied
ISSN: 2331-7019
Argitalpen urtea: 2020
Alea: 14
Zenbakia: 5
Mota: Artikulua