Quantitative waveform sampling on atomic scales
- Roelcke, C.
- Peller, D.
- Kastner, L.Z.
- Buchner, T.
- Neef, A.
- Hayes, J.
- Bonafé, F.
- Sidler, D.
- Ruggenthaler, M.
- Rubio, A.
- Repp, J.
- Huber, R.
Proceedings:
Optics InfoBase Conference Papers
ISBN: 9781557528209
Year of publication: 2021
Type: Conference paper