Evidence for faster etching at the mask-substrate interface: Atomistic simulation of complex cavities at the micron-/submicron-scale by the continuous cellular automaton

  1. Gosálvez, M.A.
  2. Ferrando, N.
  3. Fedoryshyn, Y.
  4. Leuthold, J.
  5. McPeak, K.M.
Revista:
Journal of Micromechanics and Microengineering

ISSN: 1361-6439 0960-1317

Año de publicación: 2016

Volumen: 26

Número: 4

Tipo: Artículo

DOI: 10.1088/0960-1317/26/4/045013 GOOGLE SCHOLAR