Analysis of calibration methods for direct emissivity measurements

  1. González-Fernández, L.
  2. Pérez-Sáez, R.B.
  3. Del Campo, L.
  4. Tello, M.J.
Revue:
Applied Optics

ISSN: 1539-4522 1559-128X

Année de publication: 2010

Volumen: 49

Número: 14

Pages: 2728-2735

Type: Article

DOI: 10.1364/AO.49.002728 GOOGLE SCHOLAR