In-Circuit Characterization of Low-Frequency Stability Margins in Power Amplifiers

  1. Gonzalez, J.M.
  2. Otegi, N.
  3. Anakabe, A.
  4. Mori, L.
  5. Barcenilla, A.
  6. Collantes, J.-M.
Revue:
IEEE Transactions on Microwave Theory and Techniques

ISSN: 0018-9480

Année de publication: 2019

Volumen: 67

Número: 2

Pages: 822-833

Type: Article

DOI: 10.1109/TMTT.2018.2883568 GOOGLE SCHOLAR

Objectifs de Développement Durable

La source de données: Scopus