Auger electron spectroscopical investigation of interfacial segregation in the Cu-Bi system

  1. López, G.A.
  2. Mittemeijer, E.J.
Journal:
Defect and Diffusion Forum

ISSN: 1662-9507,  1012-0386

Year of publication: 2005

Volume: 237-240

Issue: PART 2

Pages: 1141-1146

Type: Conference paper

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Data source: Scopus