Focused ion beam preparation of atom probe specimens containing a single crystallographically well-defined grain boundary

  1. Pérez-Willard, F.
  2. Wolde-Giorgis, D.
  3. Al-Kassab, T.
  4. López, G.A.
  5. Mittemeijer, E.J.
  6. Kirchheim, R.
  7. Gerthsen, D.
Revue:
Micron

ISSN: 0968-4328

Année de publication: 2008

Volumen: 39

Número: 1

Pages: 45-52

Type: Article

DOI: 10.1016/J.MICRON.2007.01.001 GOOGLE SCHOLAR
La source de données: Scopus