Focused ion beam preparation of atom probe specimens containing a single crystallographically well-defined grain boundary

  1. Pérez-Willard, F.
  2. Wolde-Giorgis, D.
  3. Al-Kassab, T.
  4. López, G.A.
  5. Mittemeijer, E.J.
  6. Kirchheim, R.
  7. Gerthsen, D.
Aldizkaria:
Micron

ISSN: 0968-4328

Argitalpen urtea: 2008

Alea: 39

Zenbakia: 1

Orrialdeak: 45-52

Mota: Artikulua

DOI: 10.1016/J.MICRON.2007.01.001 GOOGLE SCHOLAR
Datuen iturria: Scopus