Determination of the integrated x-ray scattering intensities through the electron-pair relative-motion density at the origin

  1. Valderrama, E.
  2. Fradera, X.
  3. Ugalde, J.M.
Aldizkaria:
Physical Review A - Atomic, Molecular, and Optical Physics

ISSN: 1094-1622,  1050-2947

Argitalpen urtea: 2001

Alea: 64

Zenbakia: 4

Orrialdeak: 4

Mota: Artikulua

DOI: 10.1103/PHYSREVA.64.044501 GOOGLE SCHOLAR
Datuen iturria: Scopus