Unique Thickness-Dependent Properties of the van der Waals Interlayer Antiferromagnet MnBi2Te4 Films

1. Otrokov, M.M.
2. Rusinov, I.P.
3. Blanco-Rey, M.
4. Hoffmann, M.
5. Vyazovskaya, A.Yu.
6. Eremeev, S.V.
7. Ernst, A.
8. Echenique, P.M.
9. Arnau, A.
10. Chulkov, E.V.