A precise analysis of the IEC flickermeter when subject to rectangular voltage fluctuations

  1. Ruiz, J.
  2. Gutierrez, J.J.
  3. Irusta, U.
  4. Lazkano, A.
Journal:
IEEE Transactions on Instrumentation and Measurement

ISSN: 0018-9456

Year of publication: 2009

Volume: 58

Issue: 11

Pages: 3839-3846

Type: Article

DOI: 10.1109/TIM.2009.2020837 GOOGLE SCHOLAR
Data source: Scopus