A review of flicker severity assessment by the IEC flickermeter

  1. Ruiz, J.
  2. Gutierrez, J.J.
  3. Lazkano, A.
  4. Ruiz De Gauna, S.
Journal:
IEEE Transactions on Instrumentation and Measurement

ISSN: 0018-9456

Year of publication: 2010

Volume: 59

Issue: 8

Pages: 2037-2047

Type: Article

DOI: 10.1109/TIM.2009.2031846 GOOGLE SCHOLAR
Data source: Scopus