Stress-induced phase transformations studied by in-situ transmission electron microscopy

  1. Nó, M.L.
  2. Ibarra, A.
  3. Caillard, D.
  4. San Juan, J.
Actas:
Journal of Physics: Conference Series

ISSN: 1742-6596 1742-6588

Año de publicación: 2010

Volumen: 240

Tipo: Aportación congreso

DOI: 10.1088/1742-6596/240/1/012002 GOOGLE SCHOLAR