Photothermal measurements near a 90° edge. II. Characterization of subsurface rectangular voids and close planar cracks

  1. Sánchez-Lavega, A.
  2. Salazar, A.
Revue:
Journal of Applied Physics

ISSN: 0021-8979

Année de publication: 1993

Volumen: 74

Número: 1

Pages: 548-557

Type: Article

DOI: 10.1063/1.355268 GOOGLE SCHOLAR
La source de données: Scopus