Benchmarking of patents: An application of GAM methodology
ISSN: 1134-8984
Argitalpen urtea: 2007
Zenbakia: 2
Mota: Laneko dokumentua
Beste argitalpen batzuk: Documentos de Trabajo BILTOKI
Laburpena
The present article reexamines some of the issues regarding the benchmarking of patents using the NBER data base on U.S. patents by generalizing a parametric citation model and by estimating it using GAM methodology. The main conclusion is that the estimated effects differ considerably from sector to sector, and the differences can be estimated nonparametrically but not by the parametric dummy variable approach.