Maximum likelihood refinement of electron microscopy data with normalization errors
- Scheres, S.H.W.
- Valle, M.
- Grob, P.
- Nogales, E.
- Carazo, J.-M.
ISSN: 1047-8477, 1095-8657
Année de publication: 2009
Volumen: 166
Número: 2
Pages: 234-240
Type: Article