A study on the three key concepts of White Etching Crack failure mode in its very early stages - Contrast with different testing methods
- López-Uruñuela, F.J.
- Wang, L.
- Fernández, B.
- Aguirrebeitia, J.
- Pinedo, B.
Revue:
Wear
ISSN: 0043-1648
Année de publication: 2023
Volumen: 530-531
Type: Article