Sensitivity of thermal emission spectroscopy for the study of structural phase transitions
- Echániz, T.
- González de Arrieta, I.
- Fuente, R.
- Urcelay-Olabarria, I.
- Risueño, E.
- Faik, A.
- López, G.A.
- Tello, M.J.
Revue:
Infrared Physics and Technology
ISSN: 1350-4495
Année de publication: 2018
Volumen: 93
Pages: 16-19
Type: Article