Contrast inversion in electrostatic force microscopy imaging of trapped charges: Tip-sample distance and dielectric constant dependence

  1. Riedel, C.
  2. Alegría, A.
  3. Arinero, R.
  4. Colmenero, J.
  5. Sáenz, J.J.
Revue:
Nanotechnology

ISSN: 0957-4484 1361-6528

Année de publication: 2011

Volumen: 22

Número: 34

Type: Article

DOI: 10.1088/0957-4484/22/34/345702 GOOGLE SCHOLAR